16.05.2019

Introduction seminar: Woollam Ellipsometry

Instytut Materiałów Inżynierskich i Biomedycznych Politechnika Śląska ul. Konarskiego 18a Gliwice Poland

This seminar offers a short introduction and an overview of the current status of application and research in ellipsometry. We will demonstrate the power of the Woollam spectroscopic ellipsometers by undertaking various sample measurements.

Overview
Program
Registration

This seminar offers a short introduction and an overview of the current status of application and research in ellipsometry. We will demonstrate the power of the Woollam spectroscopic ellipsometers by undertaking various sample measurements.

In the last few years the areas where spectroscopic ellipsometry is used are permanently growing due to the increasing need to characterise multilayer and multicompound systems. This technique allows very sensitive measurement of film thickness, optical constants, composition, surface and interface roughness and many more. Increasingly applications close to production are developing alongside its traditional use for research. This requirement has been addressed by the development of several in-situ solutions for process monitoring and control. During the seminar we will present basic J.A. Woollam system; Alpha-SE and showcase latest developments to address the requirements of photovoltaic applications. System will be available to demonstrate sample measurements.

Registration information:

The number of participants for the seminar is limited to 20 persons. After receiving your registration we will send a short confirmation. Final confirmation including program and description how to reach location of the seminar. The seminar will start at 09:00h and will end at around 15:30h in the afternoon. All seminar expenses including lunch will be covered by LOT-QuantumDesign GmbH. Travel and hotel expenses are to be paid and organized by the participants. The introductory seminar is considered for participants without any ellipsometry experience. Due to the huge interest last year, and the limitation of registrations we ask ellipsometer users not to register for this seminar.

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