The manufacturer Andor Technology provides a range of spectral instruments suitable for a wide range of spectroscopy applications. Czerny-Turner with different focal lengths and echelle spectrographs come pre-aligned and pre-calibrated for ease of operation. The latest addition, the on-axis, high throughput, imaging Holospec spectrograph give superb results in milliseconds, not minutes.
The vacuum spectrographs from H + P Spectroscopy include models for VUV and XUV / EUV spectroscopy based on grazing light grids. The imaging properties without input slit maximizes signal strength. The spectrographs operate in selected wavelength ranges from 1 nm to 200 nm with a spectral resolution better than 0.03 nm.
The Shamrock and Kymera series from Andor offer a wide range of spectrographs to find a solution for every application. The main difference of the four models is the focal length: 193, 328, 500 and 750 mm, respectively. All models are based on the optical design according to Czerny-Turner.
An extremely light sensitive transmission grating spectrograph with ultrafast F/1.8 aperture. The HoloSpec gathers more light than any Czerny-Turner and echelle spectrograph on the market. Therefore, it is the ideal solution for very faint spectroscopy applications. In addition, it has superior imaging properties.
Robust, compact and manual 163 mm spectrograph in crossed Czerny-Turner setup. Combined with exchangeable grating and detector the system is a general purpose device for multiple applications in spectroscopy.
Patented echelle optical design with a spectral band pass from 200 nm to 975 nm and a spectral resolution of λ/Δλ = 5000. The Andor Mechelle spectrograph displays the entire range in a single two-dimensional image and automatically captures the spectrum. The device works without any moving part.
The vacuum spectrograph is designed upon chosen gratings with grazing incidence. The H+P models comprise an aberration-corrected flat field in one or more pre-defined wavelength ranges. By that the signal intensity is maximized. They achieve a spectral resolution of up to 0.03 nm in a range from 1 nm (soft X-ray) to 200 nm (VUV). The spectral ranges from 1 to 20 nm, from 5 to 80 nm and from 40 to 200 nm are covered by a single grating. The geometry of the spectrograph is given by the wavelength or energy range and the distance of the EUV/VUV light source. The modular layout allows adaptation to all kind of vacuum chambers and different samples herein. The systems are provided with a filter holder and a motorized grating mount with permanent monitoring.